SEM Microstructure of 3 micron Thick BaM Film

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Chemical Vapor Deposition Laboratory
Millimeter-Wave and Microwave Laboratory

MRC Institute workstation and PC cluster facility
Magnetron Sputtering Laboratory

Lab Manager Benton O'Neil with the Agilent
Technologies E4440A (3Hz-26.5 GHz) PSA
Spectrum Analyzer (top) and Agilent Technologies
E8363A (45 MHz- 40 GHz) PNA Series Network
Analyzer (bottom).
Benton calibrating network analyzer.

Circulator mounted in fixture, placed in
electromagnet to provide biasing field,
while connected to network analyzer.
Closeup showing circulator, magnet,
and test cables.

AMFeR's testing center for millimeter-wave devices.

Additional calibration.

Closeup of circulator mounted in
fixture with one port match terminated.

© 2005 AMFeR